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A clearer picture of how electric fields bend a stubborn class of materials
A new imaging method is letting researchers watch, in near-real time, how electric fields reorganise the interior of ferroelectric materials, settling long-running debates about a class of crystals central to sensors, memory chips and next-generation electronics.

This article framed the result as a resolution of a specific methodological dispute, rather than a generalised breakthrough; the wire reporting on the work emphasised the imaging advance itself.
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